Tutorial 3:  Analysis of a Microstrip Lowpass Filter

Tutorial Example File: tut3_mlf.tlm

 
3.1. Preliminary Considerations

The file tut3_mlf.tlm contains data for a microstrip lowpass filter modeled by its equivalent parallel-plate waveguide model with magnetic sidewalls and non-dispersive effective permittivity. (This model has, of course, certain limitations but works well at low frequencies, in this case several GHz).

Several empirical formulae have been developed over the years to calculate the properties of the equivalent parallel-plate waveguide from the microstrip charactristics. Figure 1 shows the cross-sections of a microstrip line and its equivalent model that can be implemented in 2D since all field quantities are independent on the vertical direction.

Figure01.gif (2712 bytes)

Figure 2-10:  (a) Cross-section of a microstrip line.
(b) Its equivalent parallel plate waveguide model with magnetic sidewalls.

For convenience, such formulae have been implemented in the Microstrip Wizard that you can find under the Wizard menu. Simply key in the substrate thickness d, the relative dielectric constant of the substrate, er , followed by either the strip width W, the normalized strip width W/d, or the microstrip characteristic impedance Z0m. The Wizard then yields the effective width and effective dielectric constant that you can implement in the TLM model.

The topology of the filter appears on the screen as soon as the file tut3_mlf.tlm is opened. Magnetic walls (blue) define the geometry of the filter. The filter is terminated at both ends by reflection walls (green); the reflection coefficient of these walls has been chosen such that the input and output ports of the filter are matched. Note that the impedance of the absorbing walls is not equal to the microstrip characteristic impedance but rather the TEM wave impedance in the medium that fills the parallel plate waveguide, namely h 0/Ö eeff . A reference section with the same electrical properties as the input section is needed for the extraction of the S-parameters of the filter. This reference section appears below the filter input. Both the filter and the reference section are filled with dielectric or computation boxes, as indicated by the darker color.

Figure02.gif (12059 bytes)

Figure 2-11:  Microstrip lowpass filter implemented as a parallel-plate waveguide structure with magnetic sidewalls, and reference structure for the extraction of scattering parameters.

3.2 Define and Input the Structure

If you want to re-create the geometry of the lowpass filter, follow this recommended input sequence so that the program generates the proper values for the reflection coefficients of the reflection walls.

3.2.1 Create a new mesh

Number of cells in Z-direction: 52
Number of cells in X-direction: 15
Cell size Delta L in [mm]: 1

3.2.2 Draw the magnetic walls

3.2.3 Define the computational domain

Note If you do not want to redraw the structure, you can at least check the property of each element of .the filter. Proceed as follows:

3.2.4 Draw the reflection walls

Note:  The Relative dielectric constant is by default the value specified when creating the last Computation Region. It is thus recommended to draw the Computation Region adjacent to an absorbing wall before drawing the wall itself. However, the dielectric constant can be changed at any time. Note that the local impulse reflection coefficient (G i =-0.604351) is different from 0 as predicted by 2D-TLM Theory.

3.2.5 Draw the source regions

3.2.6. Place the probes

Up to three probes can be implemented in MEFiSTo-2D. The probes are numbered by the computer in the order in which they are have been created (1 to 3). If one of them is removed, the order is changed in a complicated manner due to internal stack manipulation. In this example, Probe 1 is the probe in the reference section. Probe 2 and Probe 3 are placed in the input and output ports of the filter. (Verify the numbering of the probes by clicking on them after activating Select Element in the Draw menu. The Status Bar indicates the number of the probe.

Note: The reference planes for the S-Parameters are defined by the position of the probes.
 

3.3. Perform the Simulation

3.3.1. Select a Source Waveform

As in the first tutorial example we inject a signal of maximum bandwidth to be certain that all relevant frequencies are excited. This signal will be a single voltage impulse.

3.3.2. Select a Sampling Mode

Again, we choose to sample the same component that we have injected, namely the node voltage Vy (equivalent to the field component Ey in the structure.

3.3.3. Set Simulation Control Data

Note:  Since the structure under test is a lowpass filter, we include the low frequency range down to DC. The source waveform (impulse) has a DC component as well.

You are now ready to start the simulation and to observe its progress. The screen should look as in Figure 2-12.

3.3.4 Start Simulation

Note:  The frequency response of Probe 3 shows already the characteristics of a lowpass filter from 0 to 1.5 GHz, with a second passband centered around 4 GHz. The spectrum of the voltage in the reference section is almost flat.

Figure 2-12: Display of the probe responses after 2048 time steps. . Top row: Time responses of probes 1 to 3. Middle row: Frequency responses (Discrete Fourier Transform) of the probes 1 to 3. Bottom row: Phase responses of the same.
Note:  The frequency domain responses are not smooth but show a pronounced ripple (Gibbs effect), particularly towards the higher frequencies. This is due to the following reasons:
a) The number of time steps chosen (2048) is insufficient.
b) The spectrum of the source waveform contains frequencies above the range of interest (0 - 6 GHz).

1.4. Extract Scattering Parameters

Before extracting scattering parameters we must verify that the three probes are assigned to the correct ports of the structure.

Probe 1 is assigned to the Reference Port,
Probe 2 is assigned to the Input Port, and
Probe 3 is assigned to the Output Port of the filter..

1.5. Simulation with a reduced bandwidth source

To smoothen the S-parameter curves, we will repeat the simulation with a source waveform tailored to the frequency range of interest. Proceed as follows:

Note:  Even though the properties of the signal have been defined in the frequency domain, the time domain waveform will be displayed. You can verify the spectral characteristics of the signal by computing its Fourier Transform. Simply create a short section of TEM transmission line, match it at both ends, and enter a source point and a probe. Then perform a TLM simulation for a sufficient number of time steps and look at the frequency response of the probe. In this way you can use MEFiSTo-2D as a spectrum analyzer for any discretized signal

You can now refine the resolution of all graphs and study all aspects of the filter response in greater detail by repeating the steps discussed in Tutorial 1. However, we will explore one more feature of MEFiSTo-2D, namely its capability to dynamically display and visualize the fields in the filter. 
 

1.6. Visualize the Electromagnetic Fields in the Filter.

If we want to observe the behavior of the filter at a certain frequency, we can excite the filter with a sinusoidal waveform at that frequency and visualize the field as it propagates through the structure. Suppose we are interested in the filter behavior at 1.6 GHz, which is the upper edge of the first passband.


Figure04.gif (19028 bytes)

Figure 2-13:  Visualization of the electric field Ey in the lowpass filter at 1.6 GHz. Note that the field is almost uniform over the wide sections of the structure, indicating that they act essentially as lumped capacitances at that frequency. The Wire Frame option has been de-selected.

You have now explored most, but not all features of MEFiSTo-2D. These will be invoked in the following tutorials.